Test Set, Semiconductor Device AN /USM-206
AEL Industries (Tracor), American Electronic Laboratories; Lansdale (PA)
- Country
- United States of America (USA)
- Manufacturer / Brand
- AEL Industries (Tracor), American Electronic Laboratories; Lansdale (PA)
- Year
- 1960 ??
- Category
- Service- or Lab Equipment
- Radiomuseum.org ID
- 263697
- Number of Transistors
- 3
- Semiconductors
- Wave bands
- - without
- Power type and voltage
- Dry Batteries / C: 6 x 1.5 Volt
- Loudspeaker
- - - No sound reproduction output.
- Material
- Bakelite case
- from Radiomuseum.org
- Model: Test Set, Semiconductor Device AN /USM-206 - AEL Industries Tracor,
- Shape
- Portable set > 8 inch (also usable without mains)
- Dimensions (WHD)
- 7 x 8.5 x 6.5 inch / 178 x 216 x 165 mm
- Notes
-
The Test Set AN/USM-206 is a solid state semiconductor tester,
capable of testing semiconductors (in and out of the circuit) Beta, and the resistance appearing across the semiconductor electrodes.Ico can be measured only out of circuit.The Test Set is operated by 6 self-contained size C batteries.The leads necessary for testing are stored in the cover.
- Net weight (2.2 lb = 1 kg)
- 3.5 lb (3 lb 8 oz) / 1.589 kg
- Mentioned in
- - - Manufacturers Literature
- Author
- Model page created by Antonio Marra. See "Data change" for further contributors.
- Other Models
-
Here you find 2 models, 2 with images and 0 with schematics for wireless sets etc. In French: TSF for Télégraphie sans fil.
All listed radios etc. from AEL Industries (Tracor), American Electronic Laboratories; Lansdale (PA)
Collections
The model Test Set, Semiconductor Device is part of the collections of the following members.